By National Research Council, Division on Engineering and Physical Sciences, Board on Assessment of National Institute of Standards and Technology Programs
The nationwide Institute of criteria and know-how (NIST) Measurements and criteria Laboratories (MSL) offer technical management for the nation's dimension and criteria infrastructure and guarantee the provision of crucial reference info and size features. At NIST's request, the nationwide examine Council (NRC) incorporates out a biennial review of the seven MSL. The evaluation makes a speciality of each one laboratory's technical caliber and advantage; and effectiveness. It additionally examines the relevance of the NIST courses and the way good laboratory amenities, apparatus, and body of workers may be able to fulfil the MSL project. This document offers an total review of the MSL by way of precise checks of every of the seven laboratories.
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Extra info for An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2002
The IIEDM addresses such information standards. Numerous standards groups meet frequently to reach agreement in these areas, which illustrates the work’s importance. Standards group meetings sponsored by the Electronics Industry Alliance (EIA) and the IEEE as well as many industry ad hoc standards groups are well attended by industry representatives. The NIST scientists attend these meetings as often as possible, but their personnel resources are too limited for them to accomplish what is needed at such meetings.
1 Organizational structure of the Electronics and Electrical Engineering Laboratory. Listed under each division are the division’s groups. the Interagency Board for Equipment Standardization and the Interoperability Working Group on standards needed by first responders in the areas of communication, detection, protection, and decontamination. The later sections of this chapter discuss in more detail the work under way in each division. Any suggestions from the panel on maximizing the effectiveness of the individual projects are included in the respective sections.
While the 30 AN ASSESSMENT OF THE NIST MEASUREMENT AND STANDARDS LABORATORIES: FY 2002 most tangible deliverables from this project are standard test procedures and characterization techniques, researchers also conduct basic research on the reliability of advanced gate dielectrics, including ultrathin silicon oxides, oxynitrides, and high-k dielectrics. Some notable results include new understanding of the role of holes in oxide wear-out mechanisms, discovery of heavy ion-induced soft breakdown of thin gate oxides, and the initial reliability characterization of HfO2 as an advanced CMOS gate dielectric.
An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2002 by National Research Council, Division on Engineering and Physical Sciences, Board on Assessment of National Institute of Standards and Technology Programs